Research and design of measuring system based on probe station

XU Ru， QIN Hui-bin， ZHENG Liang
（School of Electronic & Information， Hangzhou Dianzi University， Hangzhou 310018， China）

Abstract： In order to further research property of SMT components， a measuring system based on probe station was introduced. The system included upper computer of interface controlling and lower computer of measuring system controlling. The PC was used to design upper computer by VC++ .The microcontroller MSP430F449 and a bipolar chip AD574 were used to design lower computer. Finally， by serial port the upper computer and the lower computer could be communicated with each other. Testing results show that this probe station could give conveniently and accurately measurement results.
Key words： probe station； microcontroller；  analog to digital converter（ADC）； upper computer