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Research of 3D-Profilometry on the basis of two-dimensional
Published:2014-04-08 author:HE Bai-tong1,WU Shao-long1,2 Browse: 3153 Check PDF documents

HE Bai-tong1,WU Shao-long1,2
(1. Quzhou College of Technology,Quzhou 324000,China;
2. School of Mechanical Engineering,Zhejiang University of Technology,Hangzhou 310000,China)
Abstract:Aiming at solving the problems of three-dimensional profile measurement precision under thecondition of large gradient,the2d-paul and 2d-morlet was investigated. After the analysis of measurement precision of two kinds of wavelet transform profilometry,thetwo kinds of continuous wavelet transform profilometry measurement accuracy was established. A method was presented to the 2d-paulalgorithm as the object height gradient increases. The proposed methods were evaluated on the basis of the experimental results,themeasurement precision of two kinds of wavelet transform profilometry were tested. The results indicate that measurement result of the2d-paul method is better than 2d-morlet method as the object height gradient increases,measurement result of the 2d-paul method isbetter than2d-morlet method,and more effective in improving measurement precision of three dimensional profile measuring technology.
Key words:information optics;three-dimensional profile;2d-paul;2d-morlet

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