MA Lixin, YAN Liang, WU Xingfeng

(School of OpticalElectrical and Computer Engineering, University of

Shanghai for Science and Technology, Shanghai 200093, China)

 

Abstract: Aiming at realizing fault diagnosis of IGBT in the active power filter(APF), the fault of IGBT and driver module were analysed, the fault feature and fault detection circuit were researched, a fault diagnosis system was designed based on LabVIEW. Through the fault feature of APF, the fault detection circuit of IGBT and driver module were proposed, and the time sequence of normal mode was  compared with one of fault mode.The fault diagnosis system was tested by using LabVIEW upper computer. The experimental results indicate that the diagnosis system can detect fault of APF and identify the fault location of IGBT effectively.

Key words: active power filter(APF); fault diagnosis; insulated gate bioplar transistor(IGBT); LabVIEW